IEC - Page 138/390

• Norma Técnica IEC 60749-40

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-41

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-42

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-43

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-44

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-5

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-6

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-7

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-8

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-9

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60750

  Title: Item designation in electrotechnology
  Entity: IEC
  Subject: Electrical engineering in general

• Norma Técnica IEC 60751

  Title: Industrial platinum resistance thermometers and platinum temperature sensors
  Entity: IEC
  Subject: Temperature-measuring instruments

• Norma Técnica IEC 60752

  Title: Audio-frequency calibration tape for transverse track-recorders
  Entity: IEC
  Subject: Video systems

• Norma Técnica IEC 60753

  Title: Aluminium electrical conductor wires used in polyolefin insulated telecommunication cables
  Entity: IEC
  Subject: Wires and symmetrical cables

• Norma Técnica IEC 60754-1

  Title: Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content
  Entity: IEC
  Subject: Ignitability and burning behaviour of materials and products

• Norma Técnica IEC 60754-2

  Title: Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductibity
  Entity: IEC
  Subject: Ignitability and burning behaviour of materials and products

• Norma Técnica IEC 60754-3

  Title: Test on gases evolved during combustion of materials from cables - Part 3: Measurement of low level of halogen content by ion chromatography
  Entity: IEC
  Subject: Ignitability and burning behaviour of materials and products

• Norma Técnica IEC 60755

  Title: General safety requirements for residual current operated protective devices
  Entity: IEC
  Subject: Fuses and other overcurrent protection devices

• Norma Técnica IEC 60755-1

  Title: General safety requirements for residual current operated protective devices - Part 1: Residual current operated protective devices for DC systems
  Entity: IEC
  Subject: Fuses and other overcurrent protection devices

• Norma Técnica IEC 60756

  Title: Non-broadcast video tape recorders; time based stability
  Entity: IEC
  Subject: Video systems

• Norma Técnica IEC 60757

  Title: Code for designation of colours
  Entity: IEC
  Subject: Colour coding

• Norma Técnica IEC 60758

  Title: Synthetic quartz crystal - Specifications and guidelines for use
  Entity: IEC
  Subject: Piezoelectric devices

• Norma Técnica IEC 60759

  Title: Standard test procedures for semiconductor X-ray energy spectrometers
  Entity: IEC
  Subject: Radiation measurements

• Norma Técnica IEC 60760

  Title: Flat, quick-connect terminations
  Entity: IEC
  Subject: Plugs, socket-outlets, couplers

• Norma Técnica IEC 60761-1

  Title: Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
  Entity: IEC
  Subject: Radiation measurements

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