IEC - Page 136/390

• Norma Técnica IEC 60748-22

  Title: Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-22-1

  Title: Semiconductor devices - Integrated circuits - Part 22-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-23-1

  Title: Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures; Manufacturing line certification; Generic specification
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-23-2

  Title: Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures; Manufacturing line certification; Internal visual inspection and special tests
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-23-3

  Title: Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures; Manufacturing line certification; Manufacturers' self-audit checklist and report
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-23-4

  Title: Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures; Manufacturing line certification; Blank detail specification
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-23-5

  Title: Semiconductor devices - Integrated circuits - Part 23-5: Hybrid integrated circuits and film structures; Manufacturing line certification; Procedure for qualification approval
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-3

  Title: Semiconductor devices. Integrated circuits.. Part 3 : Analogue integrated circuits
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-3-1

  Title: Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; section 1: blank detail specification for monolithic integrated operational amplifiers
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-4

  Title: Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-4-1

  Title: Semiconductor devices; integrated circuits; part 4: interface integrated circuits; section 1: blank detail specification for linear digital-to-analogue converters (DAC)
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-4-2

  Title: Semiconductor devices; integrated circuits; Part 4: interface integrated circuits; section 2: blank detail specification for linear analogue-to-digital converters (ADC)
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-4-3

  Title: Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60748-5

  Title: Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
  Entity: IEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica IEC 60749

  Title: Semiconductor devices - Mechanical and climatic test methods
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-1

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 1: General
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-10

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-11

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-12

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-13

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-14

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-15

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-16

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-17

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
  Entity: IEC
  Subject: Semiconductor devices in general

• Norma Técnica IEC 60749-18

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
  Entity: IEC
  Subject: Semiconductor devices in general

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