DIN - Page 661/2582

• Norma Técnica DIN 50451-5

  Title: Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5: Guideline for the selection of materials and testing of their suitability for apparatus for sampling and sample preparation for the determination of trace elements in the range of micrograms per kilogram and nanograms per kilogram
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50451-6

  Title: Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NHF) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50451-7

  Title: Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50451-8

  Title: Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 8: Determination of 33 elements in high-purity sulfuric acid by ICP-MS
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50452-1

  Title: Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50452-2

  Title: Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50452-3

  Title: Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50453-1

  Title: Testing of materials for semiconductor technology; determination of etch rates of etching mixtures; silicium monocrystals; gravimetric method
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50453-2

  Title: Testing of materials for semiconductor technology; determination of etch rates of etching mixtures; silicium-dioxid coating; optical method
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50453-3

  Title: Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 3: Aluminium, gravimetric method
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50454-1

  Title: Testing of materials for semiconductor technology - Determination of dislocations in monocrystals of III-V-compound semi-conductors - Part 1: Gallium arsenide
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50454-2

  Title: Testing of materials for semiconductor technology - Determination of the dislocation etch pits density in monocrystals of III-V-compound semiconductors - Part 2: Indium phosphide
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50454-3

  Title: Testing of materials for semiconductor technology - Determination of the dislocation etch pits density in monocrystals of III-V-compound semiconductors - Part 3: Gallium phosphide
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50455-1

  Title: Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50455-2

  Title: Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50456-1

  Title: Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Determination of the thermo-mechanical dilatation of epoxy resin moulding compounds
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50456-2

  Title: Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 2: Determination of ionic impurities using pressure cooker test
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50456-3

  Title: Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 3: Determination of cationic impurities
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50457-1

  Title: Testing of materials for semiconductor technology - Determination of the volume fraction of components in dopant gas mixtures by wet-chemical methods - Part 1: Diborane in hydrogen diborane mixtures
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50457-2

  Title: Testing of materials for semiconductor technology - Determination of the volume fraction of components in dopant gas mixtures by wet-chemical methods - Part 2: Phosphine in nitrogen phosphine mixtures
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 5046

  Title: Hooks for meat and other foods; S-hook
  Entity: DIN
  Subject: Plants and articles for the food industry

• Norma Técnica DIN 50460

  Title: Determination of magnetic properties of soft magnetic materials; general, terminology and principles of measurement
  Entity: DIN
  Subject: Magnetic materials

• Norma Técnica DIN 50462-1

  Title: Testing of steel; method for determination of magnetic properties of electrical sheet and strip in the 25 cm Epstein frame; general
  Entity: DIN
  Subject: Steels with special magnetic properties

• Norma Técnica DIN 50462-2

  Title: Testing of steel; method for determination of magnetic properties of electrical sheet and strip in the 25 cm Epstein frame; determination of the total loss
  Entity: DIN
  Subject: Steels with special magnetic properties

• Norma Técnica DIN 50462-3

  Title: Testing of steel; method for determination of magnetic properties of electrical sheet and strip in the 25 cm Epstein frame; determination of magnetic polarisation and magnetic flux density in an alternating magnetic field
  Entity: DIN
  Subject: Steels with special magnetic properties

• 656
• 657
• 658
• 659
• 660
• 661
• 662
• 663
• 664
• 665
• 666

---

SEARCH

Standard/Regulation code

Search