DIN - Page 659/2582

• Norma Técnica DIN 5043-2

  Title: Radioactive luminescent pigments and paints; method of measurement of luminance and designation of luminescent paints
  Entity: DIN
  Subject: Pigments and extenders

• Norma Técnica DIN 50430

  Title: Testing of semi-conducting inorganic materials; measurement of the electrical resistivity of silicon or germanium single crystals in bars by means of the two-point-probe direct current method
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50431

  Title: Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50432

  Title: Testing of semi-conducting inorganic materials; determination of the conductivity type of silicon or germanium by means of rectification test or hot-probe
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50433-1

  Title: Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50433-2

  Title: Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of optical reflection figure
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50433-3

  Title: Testing of materials for semiconductor technology; determination of the orientation of single crystals by means of Laue back scattering
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50434

  Title: Testing of materials for semiconductor technology; detection of crystal defects in monocrystalline silicon using etching techniques on {111} and {100} surfaces
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50435

  Title: Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50436

  Title: Testing of semi-conducting inorganic materials - Measurement of the metalurgic thickness of epitaxial layers of silicon by the stacking fault method
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50437

  Title: Testing of semi-conductive inorganic materials; measuring the thickness of silicon epitaxial layer thickness by infrared interference method
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50438-1

  Title: Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50438-2

  Title: Testing of materials for semiconductor technology; determination of impurty content in silicon by infrared absorption; carbon
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50438-3

  Title: Testing of materials for use in semiconductor technology - Determination of impurity content silicon by infrared absorption - Part 3: Boron and phosphorus
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50439

  Title: Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 5044

  Title: Street lighting - Recommendations
  Entity: DIN
  Subject: Street lighting and related equipment

• Norma Técnica DIN 5044 Beiblatt

  Title: Street lighting - Elucidations
  Entity: DIN
  Subject: Street lighting and related equipment

• Norma Técnica DIN 5044-1

  Title: Stationary traffic lighting; street lighting for automobile traffic
  Entity: DIN
  Subject: Street lighting and related equipment

• Norma Técnica DIN 5044-2

  Title: Stationary traffic lighting; street lighting for automobile traffic; calculation and measurement
  Entity: DIN
  Subject: Street lighting and related equipment

• Norma Técnica DIN 50440

  Title: Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50440-1

  Title: Testing of materials for semiconductor technology; measurement of recombination carrier lifetime in silicon single crystals by means of photo conductive decay method; measurement on bar-shaped specimens
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50441-1

  Title: Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50441-2

  Title: Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 2: Testing of edge profile
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50441-3

  Title: Testing of materials for semiconductor technology; measurement of the geometric dimensions of semiconductor slices; determination of flatness deviation of polished slices by means of the multiple beam interference
  Entity: DIN
  Subject: Semiconducting materials

• Norma Técnica DIN 50441-4

  Title: Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 4: Slice diameter, diamter variation, flat diameter, flat length, flat depth
  Entity: DIN
  Subject: Semiconducting materials

• 654
• 655
• 656
• 657
• 658
• 659
• 660
• 661
• 662
• 663
• 664

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