AFNOR - Page 1088/2476

• Norma Técnica NF EN 60749-28

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-29

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 29 : latch-up test
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-3

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 3 : external visual examination
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-30

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-31

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced)
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-32

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 32 : flammability of plastic-encapsulated devices (externally induced)
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-33

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 33 : accelerated moisture resistance - unbiased autoclave
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-34

  Title: Semiconducteur devices - Mechanical and climatic test methods - Part 34 : power cycling
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-35

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 35 : acoustic microscopy for plastic encapsulated electronic components
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-36

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 36 : acceleration steady state
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-37

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 37 : board level drop test method using an accelerometer
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-38

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 38 : soft error test method for semiconductor devices with memory
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-39

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 39 : measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-4

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp Heat, steady state, highly accelerated stress test (HAST)
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-40

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 40 : board level drop test method using a strain gauge
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-42

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 42 : temperature humidity storage
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-43

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 43 : guidelines for IC reliability qualification plans
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-44

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 44 : neutron beam irradiated single event effect (SEE) test method for semiconductor devices
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-5

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-6

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 6 : storage at high temperature
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-7

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 7 : internal moisture content measurement and the analysis of other residual gases
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-8

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 8 : sealing
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-9

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 9 : permanence of marking
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 6075

  Title: Aerospace series - Static seal elements O-Ring ethylene-propylene, moulded, phosphate ester resistant (-55 oC to 107 oC) - Inch series
  Entity: AFNOR
  Subject: Aerospace fluid systems and components

• Norma Técnica NF EN 60751

  Title: Industrial platinum resistance thermometers and platinum temperature sensors
  Entity: AFNOR
  Subject: Temperature-measuring instruments

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