AFNOR - Page 1087/2476

• Norma Técnica NF EN 60747-5-2

  Title: Discrete semiconductor devices and integrated circuits - Part 5-2 : optoelectronic devices - Essential ratings and characteristics
  Entity: AFNOR
  Subject: Optoelectronics. Laser equipment

• Norma Técnica NF EN 60747-5-3

  Title: Discrete semiconductor devices and integrated circuits - Part 5-3 : optoelectronic devices - Measuring methods
  Entity: AFNOR
  Subject: Optoelectronics. Laser equipment

• Norma Técnica NF EN 60747-5-5

  Title: Semiconductor devices - Discrete devices - Part 5-5 : optoelectronic devices - Photocouplers
  Entity: AFNOR
  Subject: Optoelectronics. Laser equipment

• Norma Técnica NF EN 60749

  Title: Semicoductor devices - Mechanical and climatic test methods
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-1

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 1 : general
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-10

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 10 : mechanical shock
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-11

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 11 : rapid change of temperature - Two-fluid-bath method
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-12

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 12 : vibration, variable frequency
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-13

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-14

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 14 : robustness of terminations (lead integrity)
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-15

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 15 : resistance to soldering temperature for through-hole mounted devices
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-16

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 16 : particle impact noise dectection (PIND)
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-17

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-18

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 18 : ionizing radiation (total dose)
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-19

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 19 : die shear strength
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-2

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 2 : low air pressure
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-20

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 20 : resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-20-1

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 20-1 : handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-21

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 21 : solderability
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-22

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 22 : bond strength
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-23

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-24

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 24 : accelerated moisture resistance - Unbiased HAST
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-25

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 25 : temperature cycling
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-26

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
  Entity: AFNOR
  Subject: Semiconductor devices in general

• Norma Técnica NF EN 60749-27

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM)
  Entity: AFNOR
  Subject: Semiconductor devices in general

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