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JSA - Page 356/684
Norma Técnica JIS K 0145
Title:
Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
Entity:
JSA
Subject:
Optical measuring instruments
Norma Técnica JIS K 0146
Title:
Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0147
Title:
Surface chemical analysis - Vocabulary
Entity:
JSA
Subject:
Chemical technology (Vocabularies)
Norma Técnica JIS K 0147-1
Title:
Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy
Entity:
JSA
Subject:
Chemical technology (Vocabularies)
Norma Técnica JIS K 0147-2
Title:
Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy
Entity:
JSA
Subject:
Chemical technology (Vocabularies)
Norma Técnica JIS K 0148
Title:
Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0149-1
Title:
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
Entity:
JSA
Subject:
Optical equipment
Norma Técnica JIS K 0150
Title:
Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0151
Title:
Non-dispersive infrared gas analyzer
Entity:
JSA
Subject:
Physicochemical methods of analysis
Norma Técnica JIS K 0152
Title:
Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0153
Title:
Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Entity:
JSA
Subject:
Physicochemical methods of analysis
Norma Técnica JIS K 0154
Title:
Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0155
Title:
Surface chemical analysis - Secondary ion mass spectrometry - Linearity of intensity scale in single ion counting time-flight mass analysers
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0156
Title:
Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0157
Title:
Surface chemical analysis - Secondary ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0158
Title:
Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0159
Title:
Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0160
Title:
Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Entity:
JSA
Subject:
Physicochemical methods of analysis
Norma Técnica JIS K 0161
Title:
Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
Entity:
JSA
Subject:
Physicochemical methods of analysis
Norma Técnica JIS K 0162
Title:
Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
Entity:
JSA
Subject:
Physicochemical methods of analysis
Norma Técnica JIS K 0163
Title:
Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0164
Title:
Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0165
Title:
Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0166
Title:
Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
Entity:
JSA
Subject:
Chemical analysis
Norma Técnica JIS K 0167
Title:
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Entity:
JSA
Subject:
Chemical analysis
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