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JSA - Page 329/684
Norma Técnica JIS H 0521
Title:
Methods for weathering test of aluminium and aluminium alloys
Entity:
JSA
Subject:
Aluminium and aluminium alloys
Norma Técnica JIS H 0522
Title:
Methods of radiographic test and classification by radiographs of aluminium castings
Entity:
JSA
Subject:
Aluminium products
Norma Técnica JIS H 0523
Title:
Testing method of molten aluminium alloy cleanliness for die castings
Entity:
JSA
Subject:
Aluminium and aluminium alloys
Norma Técnica JIS H 0530
Title:
Measurement methods of polarization resistance of copper alloy tubes for condenser
Entity:
JSA
Subject:
Gas and steam turbines. Steam engines
Norma Técnica JIS H 0541
Title:
Method of alkaline salt corrosion testing for magnesium and magnesium alloys
Entity:
JSA
Subject:
Corrosion of metals
Norma Técnica JIS H 0542
Title:
Methods for determining average grain size of magnesium alloy sheets
Entity:
JSA
Subject:
Magnesium and magnesium alloys
Norma Técnica JIS H 0543
Title:
Testing method of determining bendability for magnesium alloy sheets
Entity:
JSA
Subject:
Magnesium and magnesium alloys
Norma Técnica JIS H 0544
Title:
Magnesium alloys - Flammability test method
Entity:
JSA
Subject:
Magnesium and magnesium alloys
Norma Técnica JIS H 0601
Title:
Testing methods of resistivity for germanium
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0602
Title:
Testing method of resistivity for silicon crystals and silicon wafers with four-point probe
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0603
Title:
Measurement of minority carrier life time in germanium by photoconductive decay method
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0604
Title:
Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0607
Title:
Determination of conductivity type in germanium by thermoelectromotive method
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0608
Title:
Estimation of boron content in silicon
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0609
Title:
Test methods of crystalline defects in silicon by preferential etch techniques
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0610
Title:
Method of measurement of etch pit density of germanium crystal
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0611
Title:
Methods of measurement of thickness, thickness variation and bow for silicon wafer
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0612
Title:
Testing methods of resistivity for single crystal silicon wafers with four point probe
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0613
Title:
Visual inspection for sliced and lapped silicon wafers
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0614
Title:
Visual inspection for silicon wafers with specular surfaces
Entity:
JSA
Subject:
Semiconducting materials
Norma Técnica JIS H 0615
Title:
Test method for determination of impurity concentrations in silicon crystal by photoluminescence spectroscopy
Entity:
JSA
Subject:
Non-metalliferrous minerals
Norma Técnica JIS H 1012
Title:
General rules for chemical analysis of copper and copper alloys
Entity:
JSA
Subject:
Copper and copper alloys
Norma Técnica JIS H 1051
Title:
Copper and copper alloys - Determination of copper content
Entity:
JSA
Subject:
Copper and copper alloys
Norma Técnica JIS H 1052
Title:
Methods for determination of tin in copper and copper alloys
Entity:
JSA
Subject:
Copper and copper alloys
Norma Técnica JIS H 1053
Title:
Methods for determination of lead in copper and copper alloys
Entity:
JSA
Subject:
Copper and copper alloys
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