CEN CENELEC - Page 892/1255

• Norma Técnica EN IEC 60747-16-6

  Title: Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (IEC 60747-16-6:2019)
  Entity: CEN CENELEC
  Subject: Other semiconductor devices

• Norma Técnica EN IEC 60747-17

  Title: Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (IEC 60747-17:2020)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60747-5-5

  Title: Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (IEC 60747-5-5:2020)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-10

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-12

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-13

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-15

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2020)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-17

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2019)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-18

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-20

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-26

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-28

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-30

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-39

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2021)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60749-41

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN IEC 60751

  Title: Industrial platinum resistance thermometers and platinum temperature sensors (IEC 60751:2022)
  Entity: CEN CENELEC
  Subject: Temperature-measuring instruments

• Norma Técnica EN IEC 60754-3

  Title: Test on gases evolved during combustion of materials from cables - Part 3: Measurement of low level of halogen content by ion chromatography (IEC 60754-3:2018)
  Entity: CEN CENELEC
  Subject: Ignitability and burning behaviour of materials and products

• Norma Técnica EN IEC 60757

  Title: Code for designation of colours (IEC 60757:2021)
  Entity: CEN CENELEC
  Subject: Colour coding

• Norma Técnica EN IEC 60773

  Title: Rotating electrical machines - Test methods and apparatus for the measurement of the operational characteristics of brushes (IEC 60773:2021)
  Entity: CEN CENELEC
  Subject: Components for rotating machinery

• Norma Técnica EN IEC 60779

  Title: Installations for electroheating and electromagnetic processing - Test methods for electroslag remelting furnaces (IEC 60779:2020)
  Entity: CEN CENELEC
  Subject: Electric furnaces

• Norma Técnica EN IEC 60793-1-1

  Title: Optical fibres - Part 1-1: Measurement methods and test procedures - General and guidance (IEC 60793-1-1:2022)
  Entity: CEN CENELEC
  Subject: Fibres and cables

• Norma Técnica EN IEC 60793-1-31

  Title: Optical fibres - Part 1-31: Measurement methods and test procedures - Tensile strength (IEC 60793-1-31:2019)
  Entity: CEN CENELEC
  Subject: Fibres and cables

• Norma Técnica EN IEC 60793-1-32

  Title: Optical fibres - Part 1-32: Measurement methods and test procedures - Coating strippability (IEC 60793-1-32:2018)
  Entity: CEN CENELEC
  Subject: Fibres and cables

• Norma Técnica EN IEC 60793-1-34

  Title: Optical fibres - Part 1-34: Measurement methods and test procedures - Fibre curl (IEC 60793-1-34:2021)
  Entity: CEN CENELEC
  Subject: Fibres and cables

• Norma Técnica EN IEC 60793-1-40

  Title: Optical fibres - Part 1-40: Attenuation measurement methods (IEC 60793-1-40:2019)
  Entity: CEN CENELEC
  Subject: Fibres and cables

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