CEN CENELEC - Page 726/1255

• Norma Técnica EN 60749-20

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2008)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-20-1

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 60749-20-1:2009)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-21

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 60749-21:2011)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-22

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength (IEC 60749-22:2002)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-23

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-24

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance, unbiased HAST (IEC 60749-24:2004)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-25

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling (IEC 60749-25:2003)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-26

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2013)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-27

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-28

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-29

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-3

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-30

  Title: IEC 60749-30, Ed. 1: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-31

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced) (IEC 60749-31:2002)
  Entity: CEN CENELEC
  Subject: Ignitability and burning behaviour of materials and products

• Norma Técnica EN 60749-32

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002)
  Entity: CEN CENELEC
  Subject: Ignitability and burning behaviour of materials and products

• Norma Técnica EN 60749-33

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-34

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-35

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-36

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-37

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using a accelerometer (IEC 60749-37:2008)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-38

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-39

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006)
  Entity: CEN CENELEC
  Subject: Mechanical structures for electronic equipment

• Norma Técnica EN 60749-4

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-40

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-42

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

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