CEN CENELEC - Page 725/1255

• Norma Técnica EN 60746-2

  Title: Expression of performance of electrochemical analyzers - Part 2: pH value (IEC 60746-2:2003)
  Entity: CEN CENELEC
  Subject: Chemical analysis

• Norma Técnica EN 60746-3

  Title: Expression of performance of electrochemical analyzers - Part 3: Electrolytic conductivity (IEC 60746-3:2002)
  Entity: CEN CENELEC
  Subject: Chemical analysis

• Norma Técnica EN 60747-15

  Title: Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60747-16-1

  Title: Semiconductor devices - Part 16-1: Microwave integrated circuits; Amplifiers (IEC 60747-16-1:2001)
  Entity: CEN CENELEC
  Subject: Other semiconductor devices

• Norma Técnica EN 60747-16-10

  Title: Semiconductor devices - Part 16-10: Technology approval schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004)
  Entity: CEN CENELEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica EN 60747-16-3

  Title: Semiconductor devices - Part 16-3: Microwave integrated circuits; Frequency converters (IEC 60747-16-3:2002)
  Entity: CEN CENELEC
  Subject: Integrated circuits. Microelectronics

• Norma Técnica EN 60747-16-4

  Title: Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004)
  Entity: CEN CENELEC
  Subject: Other semiconductor devices

• Norma Técnica EN 60747-16-5

  Title: Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013)
  Entity: CEN CENELEC
  Subject: Other semiconductor devices

• Norma Técnica EN 60747-5-1

  Title: Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General (IEC 60747-5-1:1997)
  Entity: CEN CENELEC
  Subject: Optoelectronics. Laser equipment

• Norma Técnica EN 60747-5-2

  Title: Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics (IEC 60747-5-2:1997)
  Entity: CEN CENELEC
  Subject: Optoelectronics. Laser equipment

• Norma Técnica EN 60747-5-3

  Title: Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods (IEC 60747-5-3:1997)
  Entity: CEN CENELEC
  Subject: Optoelectronics. Laser equipment

• Norma Técnica EN 60747-5-5

  Title: Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers (IEC 60747-5-5:2007)
  Entity: CEN CENELEC
  Subject: Optoelectronics. Laser equipment

• Norma Técnica EN 60749

  Title: Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-1

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 1: General (IEC 60749-1:2002)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-10

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock (IEC 60749-10:2002)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-11

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-12

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibrations, variable frequency (IEC 60749-12:2002)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-13

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2002)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-14

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 60749-14:2003)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-15

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2010)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-16

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) (IEC 60749-16:2003)
  Entity: CEN CENELEC
  Subject: Noise emitted by machines and equipment

• Norma Técnica EN 60749-17

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2003)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-18

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2002)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-19

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 60749-19:2003)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

• Norma Técnica EN 60749-2

  Title: Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002)
  Entity: CEN CENELEC
  Subject: Semiconductor devices in general

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