BSI - Page 1303/2460

• Norma Técnica BS EN 60749-36

  Title: Semiconductor devices - Mechanical and climatic test methods - Acceleration, steady state
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-37

  Title: Semiconductor devices - Mechanical and climatic test methods - Board level drop test method using an accelerometer
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-38

  Title: Semiconductor devices - Mechanical and climatic test methods - Soft error test method for semiconductor devices with memory
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-39

  Title: Semiconductor devices - Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
  Entity: BSI
  Subject: Mechanical structures for electronic equipment

• Norma Técnica BS EN 60749-4

  Title: Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-40

  Title: Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-42

  Title: Semiconductor devices. Mechanical and climatic test methods. Temperature and humidity storage
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-43

  Title: Semiconductor devices - Mechanical and climatic test methods. Guidelines for IC reliability qualification plans
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-44

  Title: Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-5

  Title: Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-6

  Title: Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-7

  Title: Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-8

  Title: Semiconductor devices. Mechanical and climatic test methods. Sealing
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 60749-9

  Title: Semiconductor devices. Mechanical and climatic test methods. Permanence of marking
  Entity: BSI
  Subject: Semiconductor devices in general

• Norma Técnica BS EN 6075

  Title: Aerospace series. Static seal elements O-Ring ethylene- propylene, moulded, phosphate ester resistant (- 55 °C to 107 °C). Inch series
  Entity: BSI
  Subject: Components for aerospace construction

• Norma Técnica BS EN 60751

  Title: Industrial platinum resistance thermometers and platinum temperature sensors
  Entity: BSI
  Subject: Temperature-measuring instruments

• Norma Técnica BS EN 60754-1

  Title: Test on gases evolved during combustion of materials from cables. Determination of the halogen acid gas content
  Entity: BSI
  Subject: Ignitability and burning behaviour of materials and products

• Norma Técnica BS EN 60754-2

  Title: Test on gases evolved during combustion of materials from cables. Determination of acidity (by pH measurement) and conductivity
  Entity: BSI
  Subject: Ignitability and burning behaviour of materials and products

• Norma Técnica BS EN 60756

  Title: Non-broadcast video tape recorders. Time base stability
  Entity: BSI
  Subject: Video systems

• Norma Técnica BS EN 60758

  Title: Synthetic quartz crystal. Specifications and guidelines for use
  Entity: BSI
  Subject: Piezoelectric devices

• Norma Técnica BS EN 6076

  Title: Aerospace series. Static seal elements O-Ring for straight thread tube fitting boss, ethylene-propylene, moulded, phosphate ester resistant (-55 °C to 107 °C) - Inch series
  Entity: BSI
  Subject: Components for aerospace construction

• Norma Técnica BS EN 60761-1

  Title: Equipment for continuous monitoring radioactivity in gaseous effluents. General requirements
  Entity: BSI
  Subject: Radiation measurements

• Norma Técnica BS EN 60761-2

  Title: Equipment for continuous monitoring of radioactivity in gaseous effluents. Specific requirements for radioactive aerosol monitors including transuranic aerosols
  Entity: BSI
  Subject: Radiation measurements

• Norma Técnica BS EN 60761-3

  Title: Equipment for continuous monitoring of radioactivity in gaseous. Specific requirements for radioactive noble gas monitors
  Entity: BSI
  Subject: Radiation measurements

• Norma Técnica BS EN 60761-4

  Title: Equipment for continuous monitoring of radioactivity in gaseous effluents. Specific requirements for radioactive iodine monitors
  Entity: BSI
  Subject: Radiation measurements

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