ASTM - Page 758/793

• Norma Técnica ASTM F 508

  Title: Standard Practice for Specifying Thick-Film Pastes (Withdrawn 2008)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 509

  Title: Standard Practice for Testing One-Time Carbonizing Tissue for Pinholes (Withdrawn 2015)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 51

  Title: Standard Test Method for Sizing and Counting Particulate Contaminant In and On Clean Room Garments
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 51/F 51M

  Title: Standard Test Method for Sizing and Counting Particulate Contaminant In and On Clean Room Garments
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 510

  Title: Standard Test Method for Resistance to Abrasion of Resilient Floor Coverings Using an Abrader with a Grit Feed Method
  Entity: ASTM
  Subject: Non-textile floor coverings

• Norma Técnica ASTM F 510/F 510M

  Title: Standard Test Method for Resistance to Abrasion of Resilient Floor Coverings Using an Abrader with a Grit Feed Method
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 511

  Title: Standard Test Method for Quality of Cut (Joint Tightness) of Resilient Floor Tile
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 512

  Title: Standard Specification for Smooth-Wall Poly(Vinyl Chloride) (PVC) Conduit and Fittings for Underground Installation
  Entity: ASTM
  Subject: Plastic pipes

• Norma Técnica ASTM F 513

  Title: Standard Specification for Eye and Face Protective Equipment for Hockey Players
  Entity: ASTM
  Subject: Head protective equipment

• Norma Técnica ASTM F 515

  Title: Specification for Polished Monocrystalline Silicon Slices (Withdrawn 1984)
  Entity: ASTM
  Subject: Silicones

• Norma Técnica ASTM F 516

  Title: Method for Laboratory Test for Force and Moment Properties of Passenger Car Tires (Withdrawn 1988)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 517

  Title: Practice for Aligning a Visible Beam From a Continuous-Wave Laser at a Desired Distance From a Reference Surface (Withdrawn 1994)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 518E01

  Title: Practice for Determining Effective Adhesion of Photoresist to Hard-Surface Photomask Banks and Semiconductor Wafers During Etching (Withdrawn 1996)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 519

  Title: Standard Test Method for Mechanical Hydrogen Embrittlement Evaluation of Plating/Coating Processes and Service Environments
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 52

  Title: Method of Test for Silting Index of Fluids for Processing Electron and Microelectronic Devices (Withdrawn 1979)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 520

  Title: Standard Test Method for Environmental Resistance of Aerospace Transparencies to Artificially Induced Exposures
  Entity: ASTM
  Subject: Structure and structure elements

• Norma Técnica ASTM F 521

  Title: Standard Test Methods for Bond Integrity of Transparent Laminates
  Entity: ASTM
  Subject: Rubber and plastics

• Norma Técnica ASTM F 522

  Title: Test Method for Stacking Fault Density of Epitaxial Layers of Silicon by Interference-Contrast Microscopy (Withdrawn 1998)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 523

  Title: Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces (Withdrawn 2003)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 524

  Title: Test Methods for Measuring Beam Divergence of Pulsed Lasers by the Apertured-Detector Technique (Withdrawn 2001)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 525

  Title: Standard Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe (Withdrawn 2003)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 526

  Title: Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 527E01

  Title: Practice for Adjusting Photoresist Exposure Time (Withdrawn 1996)
  Entity: ASTM
  Subject:

• Norma Técnica ASTM F 528

  Title: Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011)
  Entity: ASTM
  Subject: Transistors

• Norma Técnica ASTM F 529

  Title: Method for Interpretation of Interferograms of Nominally Plane Wavefronts (Withdrawn 1994)
  Entity: ASTM
  Subject: Measurement of electrical and magnetic quantities

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