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AFNOR - Page 1175/2476
Norma Técnica NF EN 62040-5-3
Title:
Uninterruptible power systems (UPS) - Part 5-3 : DC output UPS - Performance and test requirements
Entity:
AFNOR
Subject:
Rectifiers. Converters. Stabilized power supply
Norma Técnica NF EN 62041
Title:
Safety of transformers, reactors, power supply units and combinations thereof - EMC requirements
Entity:
AFNOR
Subject:
Transformers. Reactors
Norma Técnica NF EN 62044-1
Title:
Cores made of soft magnetic materials - Measuring methods - Part 1 : generic specification
Entity:
AFNOR
Subject:
Magnetic components
Norma Técnica NF EN 62044-2
Title:
Cores made of soft magnetic materials - Measuring methods - Part 2 : magnetic properties at low excitation level
Entity:
AFNOR
Subject:
Magnetic components
Norma Técnica NF EN 62044-3
Title:
Cores made of soft magnetic materials - Measuring methods - Part 3 : magnetic properties at high excitation level
Entity:
AFNOR
Subject:
Magnetic components
Norma Técnica NF EN 62047-1
Title:
Semiconductor devices - Micro-electromechanical devices - Part 1 : terms and definitions
Entity:
AFNOR
Subject:
Electronics (Vocabularies)
Norma Técnica NF EN 62047-10
Title:
Semiconductor devices - Micro-electromechanical devices - Part 10 : micro-pillar compression test for MEMS materials
Entity:
AFNOR
Subject:
Other semiconductor devices
Norma Técnica NF EN 62047-11
Title:
Semiconductor devices - Micro-electromechanical devices - Part 11 : test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
Entity:
AFNOR
Subject:
Semiconducting materials
Norma Técnica NF EN 62047-12
Title:
Semiconductor devices - Micro-electromechanical devices - Part 12 : bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Entity:
AFNOR
Subject:
Other semiconductor devices
Norma Técnica NF EN 62047-13
Title:
Semiconductor devices - Micro-electromechanical devices - Part 13 : bend- and shear- type test methods of measuring adhesive strenght for MEMS structures
Entity:
AFNOR
Subject:
Other semiconductor devices
Norma Técnica NF EN 62047-14
Title:
Semiconductor devices - Micro-electromechanical devices - Part 14 : forming limit measuring method of metallic film materials
Entity:
AFNOR
Subject:
Other semiconductor devices
Norma Técnica NF EN 62047-15
Title:
Semiconductor devices - Micro-electromechanical devices - Part 15 : test method of bonding strength between PDMS and glass
Entity:
AFNOR
Subject:
Other semiconductor devices
Norma Técnica NF EN 62047-16
Title:
Semiconductor devices - Micro-electromechanical devices - Part 16 : test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
Entity:
AFNOR
Subject:
Other semiconductor devices
Norma Técnica NF EN 62047-17
Title:
Semiconductor devices - Micro-electromechanical devices - Part 17 : bulge test method for measuring mechanical properties of thin films
Entity:
AFNOR
Subject:
Other semiconductor devices
Norma Técnica NF EN 62047-18
Title:
Semiconductor devices - Micro-electromechanical devices - Part 18 : bend testing methods of thin film materials
Entity:
AFNOR
Subject:
Semiconducting materials
Norma Técnica NF EN 62047-19
Title:
Semiconductor devices - Micro-electromechanical devices - Part 19 : electronic compasses
Entity:
AFNOR
Subject:
Other semiconductor devices
Norma Técnica NF EN 62047-2
Title:
Semiconductor devices - Micro-electromechanical devices - Part 2 : tensile testing methods of thin film materials
Entity:
AFNOR
Subject:
Semiconducting materials
Norma Técnica NF EN 62047-20
Title:
Semiconductor devices - Micro-electromechanical devices - Part 20 : gyroscopes
Entity:
AFNOR
Subject:
Other semiconductor devices
Norma Técnica NF EN 62047-21
Title:
Semiconductor devices - Micro-electromechanical devices - Part 21 : test method for Poisson's ratio of thin film MEMS materials
Entity:
AFNOR
Subject:
Other semiconductor devices
Norma Técnica NF EN 62047-22
Title:
Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates
Entity:
AFNOR
Subject:
Semiconducting materials
Norma Técnica NF EN 62047-25
Title:
Semiconductor devices - Micro-electromechanical devices - Part 25 : silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area
Entity:
AFNOR
Subject:
Semiconducting materials
Norma Técnica NF EN 62047-26
Title:
Semiconductor devices - Micro-electromechanical devices - Part 26 : description and measurement methods for micro trench and needle structures
Entity:
AFNOR
Subject:
Semiconducting materials
Norma Técnica NF EN 62047-3
Title:
Semiconductor devices - Micro-electromechanical devices - Part 3 : thin film standard test piece for tensile testing
Entity:
AFNOR
Subject:
Semiconducting materials
Norma Técnica NF EN 62047-4
Title:
Semiconductor devices - Micro-electromechanical devices - Part 4 : generic specifications for MEMS
Entity:
AFNOR
Subject:
Semiconducting materials
Norma Técnica NF EN 62047-5
Title:
Semiconductor devices - Micro-electromechanical devices - Part 5 : RF MEMS switches
Entity:
AFNOR
Subject:
Other semiconductor devices
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