IEC - Page 100/390

• Norma Técnica IEC 60512-25-3

  Title: Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c; Rise time degradation
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-25-4

  Title: Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d; Propagation delay
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-25-5

  Title: Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-25-6

  Title: Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-25-7

  Title: Connectors for electronic equipment - Tests and measurements - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR)
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-25-9

  Title: Connectors for electrical equipment - Tests and measurements - Part 25-9: Signal integrity tests - Test 25i: Alien crosstalk
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-26-100

  Title: Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-27-100

  Title: Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on IEC 60603-7 series connectors - Tests 27a to 27g
  Entity: IEC
  Subject: Firefighting

• Norma Técnica IEC 60512-27-200

  Title: Connectors for electrical and electronic equipment - Tests and measurements - Part 27-200: Additional specifications for signal integrity tests up to 2000 MHz on IEC 60603-7 series connectors - Tests 27a to 27g
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-28-100

  Title: Connectors for electrical and electronic equipment - Tests and measurements - Part 28-100: Signal integrity tests up to 2000 MHz - Tests 28a to 28g
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-29-100

  Title: Connectors for electronic equipment - Tests and measurements - Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors - Tests 29a to 29g
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-3

  Title: Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 3 : Current-carrying capacity tests
  Entity: IEC
  Subject: Electromechanical components for electronic and telecommunications equipment in general

• Norma Técnica IEC 60512-3-1

  Title: Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests; Test 3a: Insulation resistance
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-4

  Title: Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 4 : Dynamic stress tests
  Entity: IEC
  Subject: Electromechanical components for electronic and telecommunications equipment in general

• Norma Técnica IEC 60512-4-1

  Title: Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests; Test 4a: Voltage proof
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-4-2

  Title: Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests; Test 4b: Partial discharge
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-4-3

  Title: Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests; Test 4c: Voltage proof of pre-insulated crimp barrels
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-5

  Title: Electromechanical components for electronic equipment; basic testing procedures and measuring methods; part 5: impact tests (free components), static load tests (fixed components), endurance tests and overload tests
  Entity: IEC
  Subject: Electromechanical components for electronic and telecommunications equipment in general

• Norma Técnica IEC 60512-5-1

  Title: Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests; Test 5a: Temperature rise
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-5-2

  Title: Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-5A

  Title: Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 5 : Impact tests (free components), static load tests (fixed components), endurance tests and overload tests.
  Entity: IEC
  Subject: Electronic components in general

• Norma Técnica IEC 60512-5B

  Title: Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 5 : Impact tests (free components), static load tests (fixed components), endurance tests and overload tests.
  Entity: IEC
  Subject: Mechanical structures for electronic equipment

• Norma Técnica IEC 60512-6

  Title: Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 6 : Climatic tests and soldering tests
  Entity: IEC
  Subject: Electromechanical components for electronic and telecommunications equipment in general

• Norma Técnica IEC 60512-6-1

  Title: Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests; Test 6a: Acceleration, steady state
  Entity: IEC
  Subject: Plug-and-socket devices

• Norma Técnica IEC 60512-6-2

  Title: Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests; Test 6b: Bump
  Entity: IEC
  Subject: Plug-and-socket devices

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