DIN - Page 539/2582

• Norma Técnica DIN 44476-3

  Title: Semiconductor devices and integrated circuits; integrated circuit memories; terms for static read/write memories
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-1

  Title: Measuring methods for integrated circuits; survey
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-10

  Title: Electrical measuring methods for integrated circuits; short-circuit output current I
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-11

  Title: Electrical measuring methods for integrated circuits; output voltages V and V
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-12

  Title: Electrical measuring methods for integrated circuits; retrigger time t
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-13

  Title: Electrical measuring methods for integrated circuits; propagation times t and t
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-14

  Title: Electrical measuring methods for integrated circuits; transition time t and delay time t
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-15

  Title: Electrical measuring methods for integrated circuits; set-up time t
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-16

  Title: Electrical measuring methods for integrated circuits; output pulse duration t
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-17

  Title: Electrical measuring methods for integrated circuits; resolution time t
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-18

  Title: Electrical measuring methods for integrated circuits; maximum switching frequency (f)
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-19

  Title: Electrical measuring methods for integrated circuits; recovery time t
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-2

  Title: Electrical measuring methods for integrated circuits; holdtime t
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-20

  Title: Electrical measuring methods for integrated circuits; verification of the function
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-21

  Title: Electrical measuring methods for integrated circuits; differential-input bias current (for sense amplifiers and line receivers with differential inputs and no output directly accessible)
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-22

  Title: Electrical measuring methods for integrated circuits; common-mode input triggering voltage (for sense amplifiers and line receivers with differential inputs)
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-23

  Title: Electrical measuring methods for integrated circuits; differential-mode input overload recovery time, common-mode input overload recovery time (for sense amplifiers and line receivers with differential inputs and strobe)
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-24

  Title: Electrical measuring methods for integrated circuits; hysteresis voltage U and input threshold voltage U
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-25

  Title: Electrical measuring methods for integrated circuits; input stabilization coefficient k
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-26

  Title: Electrical measuring methods for integrated circuits; ripple rejection ratio k, input stabilization coefficient k
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-27

  Title: Electrical measuring methods for integrad circuits; load stabilization coefficient k
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-28

  Title: Electrical measuring methods for integrad circuits; output noise voltage U
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-29

  Title: Electrical measuring methods for integrated circuits; temperatur coefficient of regulated output voltage
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-3

  Title: Electrical measuring methods for integrated circuits; supply current I, static
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

• Norma Técnica DIN 44480-30

  Title: Electrical measuring methods for integrated circuits; quiescent current I
  Entity: DIN
  Subject: Integrated circuits. Microelectronics

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